Advanced multifunctional computing systems realized in nanoelectronic technologies hold the promise of a significant increase of the computational capability that will offer end-users ever improving services and functionalities (e.g., next generation mobile devices, cloud services, embedded systems etc. However, the same path that is leading technologies toward these remarkable achievements is also making electronic devices increasingly unreliable posing a threat to our society that is depending on the computers and electronic devices in every aspect of human activities. Hence new techniques introducing resilience into the nanoelectronics systems taking into account the specific requirements of different domains are urgently needed.
This tutorial-style workshop delivers a broad overview of the cutting-edge topics in the area af nanoelectronic systems' resilience. It provides a unique chance to join experts from three on-going European projects as well as researchers working in the area of reliable electronic system design. The topics that will be covered include, but are not limited to, aging modeling, life-time prediction, error-checking, embedded instruments for system health monitoring, fault management, resilient many-core architectures, design validation/verification and automated debug.
RENS'16 will include a keynote, embedded tutorials from 3 EU projects (Horizon 2020 Twinning Action TUTORIAL, FP7 STREP BASTION and Horizon 2020 RIA IMMORTAL), a panel, a special session, posters and demonstrations as well as social activities.
Call for Posters/Demonstrations
The RENS Workshop is looking forward to poster presentations and tool demonstrations. All the contributions to be e-mailed as one page extended abstract to firstname.lastname@example.org by July 31st.
RENS'16 Workshop takes place in Park Inn by Radisson Meriton Conference & Spa Hotel Tallinn. Registration should be done at the VLSI-SoC'16 Registration Page.