10th European Test Symposium

Reval Hotel Olümpia, Tallinn, Estonia
May 22-25, 2005


General Information
 ETS'05 Home
 All ETW Home
 Committees
 Contacts
Call for Papers
 HTML-version
 PDF-version
Registration
 Registration Form
 Hotel Booking
 Travel Grants
 Visa Information
Program
 ETS at a Glance
 ETS Program
 TTEP Tutorials
 Social Program
Author Instructions
 Paper Submission
 Review Criteria
 Publication Policy
Conference Location
 How to get there?
 Reval Hotel Olümpia
 Conference Venue
 About Tallinn
 Tallinn City Map
 Tallinn in Photos
 Video of Tallinn
 About Estonia

European Board Test WS
 EBTW Home
 EBTW Call for Papers
 EBTW Registration Form
 EBTW Fees

IST Project REASON WS
 About the Workshop
 REASON WS Program
 REASON WS Abstracts

Nov 24, 2017

Call for Papers

The IEEE European Test Symposium (ETS) is a well-recognized forum for presenting and discussing hot topics, trends, emerging results, and practical applications in the area of electronic-based circuit and system testing.

The 2005 edition of the symposium will take place in Tallinn, whose beautiful Old Town with its fascinating medieval architecture and slender church spires is included in the UNESCO World Heritage list. ETS’05 will be co-sponsored by the IEEE Computer Society – Test Technology Technical Council (TTTC) and the Tallinn University of Technology.

We cordially invite you to participate and submit your contributions to ETS’05, which includes (but is not limited to) the following topics:

  • Analog, Mixed-Signal, and RF Test
  • ATE Hardware and Software
  • ATPG and High-Level TPG
  • Current based testing
  • Debug and Diagnosis
  • Defect/Fault Tolerance and Reliability
  • Design Verification/Validation
  • Emerging Testability Standards
  • Failure Analysis, Defect and Fault Modeling
  • Fault Simulation
  • FPGA Test
  • High-Level DfT
  • Low-Cost Testers
  • Memory and Processor Test
  • MEMS Testing
  • On-Line and Off-Line BIST
  • Power issues in testing
  • Scan-Based Techniques and Boundary Scan
  • Self-Repair Methodologies
  • Signal Integrity Test
  • System Test
  • Test of Embedded Cores and System-on-Chip
  • Test of MCMs and Boards
  • Test Resource Partitioning and Embedded Test
  • Test Synthesis and Synthesis for Testability
  • Yield Analysis and Enhancement

Submissions
ETS’05 seeks for sereval types of contributions, including Research Contributions, Application Contributions, Emerging Ideas Contributions, PhD student forum Contributions, ...
Review criteria and publication policy are posted at the web page http://www.ttu.ee/ati/ETS. Electronic submission of PDF files via this www page is required.

Proceedings
Formal proceedings of selected papers published by the IEEE Computer Society and informal proceedings will be distributed to every participant, during the Symposium.

Key Dates

  • Submission deadline: December 10th, 2004
  • Notification of acceptance: February 10th, 2005
  • Camera ready: March 12th, 2005

IEEE TTTC Test Technology Educational Program (TTEP)
TTEP tutorials will be offered during May 22 on emerging test technology topics. Tutorial proposals should be submitted according to the guidelines given at http://tab.computer.org/tttc/teg/ttep.

Further Information

Raimund UBAR
General Co-Chair
Tallinn University of Technology
Department of Computer Engineering
Raja 1512618
Tallinn, Estonia
Tel.: +372-6202252
Fax: +372-6202253
E-mail: raiub@pld.ttu.ee

Paolo PRINETTO
General Co-Chair
Politecnico di Torino
Corso degli Abruzzi, 24
I-10129 Torino TO, Italy
Tel.: +39-011-564.7007
Fax: +39-011-564.7099
E-mail: Paolo.Prinetto@polito.it

Michel RENOVELL
Program Chair
LIRMM
161, rue ADA
34 392 MONTPELLIER CEDEX 5, France
Tel: (33) 467 418523
Fax: (33) 467 418500
E-mail: renovell@lirmm.fr